JB/T 13686-2019
光栅编码器加速寿命试验方法
Grating encoders—Accelerated life tests methods
2019-08-02 发布
2020-04-01 实施
目次
前言…………………………………………………………………………………………………………………………………………………………………………1
1 范围…………………………………………………………………………………………………………………………………………………………………………1
2 规范性引用文件………………………………………………………………………………………………………………………………………….1
3 术语和定义………………………………………………………………………………………………………………………………………………………………1
4 加速寿命试验方法……………………………………………………………………………………………………………………………………………1
4.1 试验准备…………………………………………………………………………………………………………………………………………………………………1
4.2 试验设备………………………………………………………………………………………………………………………………………………….1
4.3 失效的判定………………………………………………………………………………………………………………………………………………2
4.4 抽样原则……………………………………………………………………………………………………………………………………………………….2
4.5 试验应力……………………………………………………………………………………………………………………………………………………….2
4.6 试验步骤…………………………………………………………………………………………………3
4.7 加速寿命模型………………………………………………………………………………………………………………………………………… 3
5 寿命评估…………………………………………………………………………………………………………………………………………….3
表1 试验应力及设备对照表………………………………………………………………………………………………………………………………….1
表2 编码器加速寿命试验的应力选择………………………………………………………………………………………………………………2
表 3 各应力水平试验时间………………………………………………………………………………………………………………………………3